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Antunes, J., and N. Ferreira Neves, "Recycling test cases to detect security vulnerabilities", Software Reliability Engineering (ISSRE), 2012 IEEE 23rd International Symposium on: IEEE, pp. 231–240, 2012.
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Antunes, J., and N. Ferreira Neves, "Automatically complementing protocol specifications from network traces", Proceedings of the 13th European Workshop on Dependable Computing: ACM, pp. 87–92, 2011.
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Antunes, J., and N. Ferreira Neves, "Diveinto: Supporting diversity in intrusion-tolerant systems", Reliable Distributed Systems (SRDS), 2011 30th IEEE Symposium on: IEEE, pp. 137–146, 2011.
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Antunes, J., and N. Ferreira Neves, "Using behavioral profiles to detect software flaws in network servers", Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on: IEEE, pp. 1–10, 2011.
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Antunes, J., N. Ferreira Neves, M. Correia, P. Verissimo, and R. Neves, "Vulnerability discovery with attack injection", Software Engineering, IEEE Transactions on, vol. 36, no. 3: IEEE, pp. 357–370, 2010.
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Antunes, J., and N. Ferreira Neves, "Building an automation towards reverse protocol engineering", 2012-10-10]. http://homepages. di. fc. ul. pt/\~{} nuno/PAPERS/INFORUM09. pdf, 2009.
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Antunes, J., N. Ferreira Neves, and P. Verissimo, "Detection and prediction of resource-exhaustion vulnerabilities", Software Reliability Engineering, 2008. ISSRE 2008. 19th International Symposium on: IEEE, pp. 87–96, 2008.
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Teixeira, E., J. Antunes, and N. Ferreira Neves, "Avaliação de Ferramentas de Análise Estática de Código para Detecção de Vulnerabilidades", Actas da 3ª Conferência Nacional Sobre Segurança Informática nas Organizações, Lisboa, Portugal, 2007.
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Antunes, J., N. Ferreira Neves, and P. Verissimo, Finding Local Resource Exhaustion Vulnerabilities, : International Symposium on Software Reliability Engineering, 2007.
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Neves, N. Ferreira, J. Antunes, M. Correia, P. Verissimo, and R. Neves, "Using attack injection to discover new vulnerabilities", Dependable Systems and Networks, 2006. DSN 2006. International Conference on: IEEE, pp. 457–466, 2006.